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08/979,599 | AMD.5104:

METHOD OF SCALING DIELECTRIC THICKNESS IN A SEMICONDUCTOR PROCESS WITH ION IMPLANTATION

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Application #

08/979,599

Confirmation #

5928

Attorney Docket #

AMD.5104

Patent #

6,054,374open_in_new
Issued - 04/25/2000

Filing or 371 (c) date

11/26/1997

Status

Patented Case 04/14/2000

Documents & transaction history

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